Aufgrund von Wartungsarbeiten ist die Suche von Publikationen nach Autor:innen derzeit nicht möglich.
Vasillis Vlachokyriakos; Clara Crivellaro; Peter C. Wright; Evika Karamagioli; Eleni-Revekka Staiou; Dimitris Gouscos; Rowan Thorpe; Antonio Krüger; Johannes Schöning; Matt Jones; Shaun W. Lawson; Patrick Olivier
In: Proceedings of the 2017 CHI Conference on Human Factors in Computing Systems. ACM International Conference on Human Factors in Computing Systems …
Gunther Reinhart; Detlef Zühlke
In: Gunther Reinhart. Handbuch Industrie 4.0 - Geschäftsmodelle, Prozesse, Technik. Pages XXXI-XL, ISBN 978-3-446-44642-7, Carl Hanser Verlag GmbH & …
Max Birtel; Fabian Quint; Martin Ruskowski
In: M. Burghardt; R. Wimmer; C. Wolff; C. Womser-Hacker (Hrsg.). Mensch und Computer 2017 - Workshopband. Mensch und Computer (MuC-2017), September …
Mauro Isaja; John Soldatos; Volkan Gezer
In: Eleventh International Conference on Mobile Ubiquitous Computing. International Conference on Mobile Ubiquitous Computing, Systems, Services and …
Daniel Porta
PhD-Thesis, Universität des Saarlandes, 2017.
Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill
In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …
Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli
In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.
Arighna Deb; Robert Wille; Rolf Drechsler
In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …
Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler
In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …
Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler
In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …
