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Zeige Ergebnisse 41 bis 50 von 507
  1. Peter Fettke; Robert Risse; Fritz Esterer

    Anwendungspotentiale von Deep Learning im Process Mining in der Steuerabteilung am Beispiel von Henkel

    In: IM+io, Vol. 4, Pages 84-89, AWSI Publishing, 12/2017.

  2. Olga Zlatkin-Troitschanskaia; Gabriel Wittum; Andreas Dengel (Hrsg.)

    Positive Learning in the Age of Information (PLATO) - A blessing or a curse?

    ISBN 978-3-658-19566-3, Springer VS, Wiesbaden, 12/2017.

  3. Tandra Ghose; Yannik T. H. Schelske; Takeshi Suzuki; Andreas Dengel

    Low-level Pixelated Representations suffice for Aesthetically Pleasing Contrast Adjustment in Photographs

    In: Psihologija, Vol. 50, No. 3, Pages 239-270, Serbian Psychological Society, 2017.

  4. Hans-Wolfgang Micklitz; Lucia Reisch; Gesche Joost; Helga Zander-Hayat (Hrsg.)

    Verbraucherrecht 2.0 - Verbraucher in der digitalen Welt

    ISBN 9783848741878, Nomos, 2017.

  5. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  6. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  7. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  8. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …

  9. Saeideh Shirinzadeh; Mathias Soeken; Pierre-Emmanuel Gaillardon; Giovanni De Micheli; Rolf Drechsler

    Endurance Management for ResistiveLogic-In-Memory Computing Architectures

    In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.

  10. Muhammad Hassan; Vladimir Herdt; Hoang M. Le; Mingsong Chen; Daniel Große; Rolf Drechsler

    Data Flow Testing for Virtual Prototypes

    In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.