In: Proceedings of the IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering. IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2022), IEEE, 2022.
Zur PublikationMaurice Rekrut; Andreas Fey; Johannes Ihl; Tobias Jungbluth; Matthias Nadig; Antonio Krüger
In: Proceedings of the IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering. IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2022), October 26-28, Rome, Italy, IEEE, 2022.
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