Skip to main content Skip to main navigation

Publikationen

 

Aufgrund von Wartungsarbeiten ist die Suche von Publikationen nach Autor:innen derzeit nicht möglich.

Zeige Ergebnisse 151 bis 160 von 536
  1. TSViz: Demystification of Deep Learning Models for Time-Series Analysis

    In: Computing Research Repository eprint Journal (CoRR), Vol. abs/1802.02952, Pages 1-13, ArXiv, 2018.

  2. Lukas Ruff; Robert Vandermeulen; Nico Goernitz; Lucas Deecke; Shoaib Ahmed Siddiqui; Alexander Binder; Emmanuel Müller; Marius Kloft

    Deep One-Class Classification

    In: International Conference on Machine Learning (ICML-2018). International Conference on Machine Learning (ICML-2018), Proceedings of Machine …

  3. David Harbecke; Robert Schwarzenberg; Christoph Alt

    Learning Explanations From Language Data

    In: The 2018 EMNLP Workshop BlackboxNLP: Analyzing and Interpreting Neural Networks for NLP - Proceedings of the First Workshop. Analyzing and …

  4. Yang Li; Qingliang Miao; Ji Geng; Christoph Alt; Robert Schwarzenberg; Leonhard Hennig; Changjian Hu; Feiyu Xu

    Question Answering for Technical Customer Support

    In: Min Zhang; Vincent Ng; Dongyan Zhao; Sujian Li; Hongying Zan (Hrsg.). Natural Language Processing and Chinese Computing. Pages 3-15, ISBN …

  5. Kelly Parker; Patrick Trampert; Verena Tinnemann; Diana Peckys; Tim Dahmen; Niels de Jonge

    Linear Chains of HER2 Receptors Found in the Plasma Membrane Using Liquid-Phase Electron Microscopy

    In: Biophysical Journal, Vol. 115, Pages 503-513, Elsevier, 6/2018.

  6. Patrick Trampert; Wu Wang; Delei Chen; Raimond BG Ravelli; Tim Dahmen; Peter J Peters; Christian Kübel; Philipp Slusallek

    Exemplar-based inpainting as a solution to the missing wedge problem in electron tomography

    In: Ultramicroscopy, Vol. 191, Pages 1-10, Elsevier, 8/2018.

  7. Patrick Trampert; Faysal Bourghorbel; Pavel Potocek; Maurice Peemen; Christian Schlinkmann; Tim Dahmen; Philipp Slusallek

    How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?

    In: Ultramicroscopy, Vol. 191, Pages 11-17, Elsevier, 8/2018.

  8. Patrick Trampert; Tim Dahmen; Philipp Slusallek

    Fact or Fiction: Maximal Image Quality with Minimal Dwell Time

    In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 480-481, Cambridge University Press, 8/2018.

  9. Tim Dahmen; Patrick Trampert; Philipp Slusallek

    Blob-based Algebraic Reconstruction Technique for Computed Laminography

    In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 994-995, Cambridge University Press, 8/2018.

  10. Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek

    Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy

    In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 700-701, Cambridge University Press, 8/2018.