Aufgrund von Wartungsarbeiten ist die Suche von Publikationen nach Autor:innen derzeit nicht möglich.
Dhruv Aditya Mittal; Hymalai Bello; Bo Zhou; Mayank Shekhar Jha; Sungho Suh; Paul Lukowicz
In: IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society. Annual Conference of the IEEE Industrial Electronics Society …
Michael Grohs; Peter Pfeiffer; Jana-Rebecca Rehse
In: 2023 5th International Conference on Process Mining (ICPM). International Conference on Process Mining (ICPM-2023), Pages 113-120, IEEE, 2023.
Vassilios Yfantis; Alexander Babskiy; Bastian Dörig; Thorsten Winterer; Achim Wagner; Martin Ruskowski
In: IFAC-PapersOnLine, Vol. 56, No. 2, Pages 5382-5387, Elsevier, 2023.
William Motsch; Vassilios Yfantis; Achim Wagner; Martin Ruskowski
In: IFAC-PapersOnLine, Vol. 56, No. 2, Pages 2969-2975, Elsevier, 2023.
Aleksandr Sidorenko; William Motsch; Michael Van Bekkum; Nikolaos Nikolakis; Kosmas Alexopoulos; Achim Wagner
In: Frontiers in Artificial Intelligence, Vol. 6, Frontiers Media SA, 2023.
Marco Simon; Simon Jungbluth; Abdullah Farrukh; Magnus Volkmann; Jesko Hermann; Martin Ruskowski
In: 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE International Conference on Emerging …
Andreas Wagner; Simon Lamoth; Magnus Volkmann; Jesko Hermann; Martin Ruskowski
Pascal Rübel; Nastaran Moarefvand; William Motsch; Achim Wagner; Martin Ruskowski
Christoph Geißler; Paula Gauselmann; Christian Jilek; Heiko Maus; Christian Frings; Tobias Tempel
In: Nature Scientific Reports (Sci Rep), Vol. 13, No. 13938, Pages 1-9, Springer Nature, 2023.
Noshaba Cheema; Rui Xu; Nam Hee Kim; Perttu Hämäläinen; Vladislav Goliyanik; Marc Habermann; Christian Theobalt; Philipp Slusallek
In: Conference Papers. ACM SiggraphAsia (SigAsia-2023), December 12-15, Sydney, Australia, ISBN 979-8-4007-0315-7/23/12, ACM, 2023.