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Zeige Ergebnisse 81 bis 90 von 507
  1. Christoph Pinkel; Carsten Binnig; Ernesto Jiménez-Ruiz; Evgeny Kharlamov; Andriy Nikolov; Andreas Schwarte; Christian Heupel; Tim Kraska

    IncMap: A Journey towards Ontology-based Data Integration

    In: Bernhard Mitschang; Daniela Nicklas; Frank Leymann; Harald Schöning; Melanie Herschel; Jens Teubner; Theo Härder; Oliver Kopp; Matthias Wieland …

  2. Alex Galakatos; Andrew Crotty; Emanuel Zgraggen; Carsten Binnig; Tim Kraska

    Revisiting Reuse for Approximate Query Processing

    In: Proceedings of the VLDB Endowment (PVLDB), Vol. 10, No. 10, Pages 1142-1153, Association for Computing Machinery (ACM), 2017.

  3. Erfan Zamanian; Carsten Binnig; Tim Kraska; Tim Harris

    The End of a Myth: Distributed Transaction Can Scale

    In: Proceedings of the VLDB Endowment (PVLDB), Vol. 10, No. 6, Pages 685-696, Association for Computing Machinery (ACM), 2017.

  4. Abdallah Salama; Carsten Binnig; Tim Kraska; Ansgar Scherp; Tobias Ziegler

    Rethinking Distributed Query Execution on High-Speed Networks

    In: IEEE Data Engineering Bulletin, Vol. 40, No. 1, Pages 27-37, IEEE, 2017.

  5. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …

  6. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  7. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  8. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  9. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …