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Publikationen

Zeige Ergebnisse 341 bis 350 von 14584.
  1. Herstellerneutrale Integration eines Batterie-Energiespeicher-Systems in eine fähigkeitsbasierte Produktion

    In: VDI-Automation – Kongress 2025. VDI Automatisierungskongress (AUTOMATION-2025), VDI Verlag GmbH, 2025.

  2. Andreas Emrich; Jan Gronewald; Michael Frey; Anna K. Hildebrandt; Andreas Hildebrandt; Peter Loos

    Understanding Agentic Systems as Business Processes: A Vision for Process-Driven GenAI Engineering

    In: Tobias Greff; Peter Pfeiffer (Hrsg.). Joint Proceedings of the WI 2025 Workshops Regulation of AI Systems and Gen AI for Business Process Management. Internationale Tagung Wirtschaftsinformatik (WI-2025), Workshop on Gen AI for Business Process Management, located at WI-2025, September 13-17, Münster, Germany, CEUR Workshops, 2025.

  3. Efficient Evolution of Variable Ordering for Binary Decision Diagram Optimization

    In: IEEE Transactions on Evolutionary Computation, Pages 1-11, IEEE, 5/2025.

  4. Khushboo Qayyum; Chandan Jha; Sallar Ahmadi-Pour; Muhammad Hassan; Rolf Drechsler

    LLM-assisted Bug Identification and Correction for Verilog HDL

    In: ACM Transactions on Design Automation of Electronic Systems (TODAES), Vol. 30, No. 06, Pages 1-28, ACM, 10/2025.

  5. Mohamed Nadeem; Luca Müller; Chandan Jha; Rolf Drechsler

    Advanced And-Inverter Graph Decomposition Technique for Reducing Circuit Complexity

    In: ACM Transactions on Design Automation of Electronic Systems (TODAES), ACM, 2025.

  6. Adrian Lutsch; Muhammad El-Hindi; Zsolt István; Carsten Binnig

    Towards High-performance and Trusted Cloud DBMSs

    In: Datenbank-Spektrum (Spektrum), Vol. 25, No. 1, Pages 39-50, Springer, 2025.

  7. Chandan Jha; Sumit Kumar Jha; Ulf Schlichtmann; Rolf Drechsler

    Formal Verification Techniques and Reliability Methods for RRAM-based Computing-in-Memory

    In: 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), October 21-23, Barcelona, Spain, IEEE, 2025.

  8. Fatma Ozcan; Yeounoh Chung; Yannis Chronis; Lyubomir Ganev; Yawen Wang; Carsten Binnig; Johannes Wehrstein; Gaurav Tarlok Kakkar; Sami Abu-el-haija

    LLMs and Databases: A Synergistic Approach to Data Utilization

    In: IEEE Data Engineering Bulletin, Vol. 49, No. 1, Pages 32-44, IEEE, 2025.