In: 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), October 21-23, Barcelona, Spain, IEEE, 2025.
Fatma Ozcan; Yeounoh Chung; Yannis Chronis; Lyubomir Ganev; Yawen Wang; Carsten Binnig; Johannes Wehrstein; Gaurav Tarlok Kakkar; Sami Abu-el-haija
Jahrestagung der Gesellschaft für Informatik (INFORMATIK-2025), The Wide Open: Offenheit von Source bis Science, September 16-19, Potsdam, Germany, Gesellschaft für Informatik eV. 2025.