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Jahr: 2016
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Zeige Ergebnisse 61 bis 70 von 541.

  1. Riaz Ahmad; M. Zeshan Afzal; S. Faisal Rashid; Marcus Liwicki; Thomas Breuel; Andreas Dengel

    KPTI: Katib’s Pashto Text Imagebase and DeepLearning Benchmark

    In: 15th International Conference on Frontiers in Handwriting Recognition. International Conference on Frontiers in Handwriting Recognition (ICFHR), IEEE, 2016.

  2. M Zeshan Afzal Riaz Ahmad

    KPTI: Katib’s Pashto Text Imagebase and DeepLearning Benchmark

    In: KPTI: Katib&'s Pashto Text Imagebase and DeepLearning Benchmark. International Conference on Frontiers in Handwriting Recognition (ICFHR), 15th International Conference on Frontiers in Handwriting Recognition, IEEE, 2016.

  3. Bertram Taetz; Gabriele Bleser; Vladislav Golyanik; Didier Stricker

    Occlusion-Aware Video Registration for Highly Non-Rigid Objects Supplementary Material

    DFKI Kaiserslautern, DFKI Research Reports (RR), Vol. 1, 3/2016.

  4. Jörn Hees; Benjamin Adrian; Ralf Biedert; Thomas Roth-Berghofer; Andreas Dengel

    TSSort: Probabilistic Noise Resistant Sorting

    In: Computing Research Repository eprint Journal (CoRR), Vol. abs/1606.05289, Pages 1-10, arXiv, 2016.

  5. Patrick Trampert; Delei Chen; Sviatoslav Bogachev; Tim Dahmen; Philipp Slusallek

    Dictionary-based Filling of the Missing Wedge in Electron Tomography

    In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Pages 554-555, Vol. 22, No. Suppl 3, Cambridge University Press, 7/2016.

  6. Patrick Trampert; Sviatoslav Bogachev; Nico Marniok; Tim Dahmen; Philipp Slusallek

    A Comparative Study of Three Marker Detection Algorithms in Electron Tomography

    In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Pages 1044-1045, Vol. 22, No. Suppl 3, Cambridge University Press, 2016.

  7. Tim Dahmen; Philipp Slusallek; Patrick Trampert; Frank Mücklich; Michael Engstler; Christoph Pauly; Niels de Jonge

    Smart Microscopy: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

    In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Page 632, Vol. 22, No. Suppl 3, Cambridge University Press, 2016.

  8. Claudia Peersman; Christian Schulze; Awais Rashid; Margaret Brennan; Carl Fischer

    iCOP: Live forensics to reveal previously unknown criminal media on P2P networks

    In: Eoghan Casey (Hrsg.). Digital Investigation, Vol. 18, Pages 1-2, Elsevier Science Publishers B. V. Amsterdam, 8/2016.

  9. Stephan Eggersglüß; Stefan Holst; Daniel Tille; Kohei Miyase; Xiaoqing Wen

    Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test

    In: The 25th Asian Test Symposium. Asian Test Symposium (ATS-25), November 21-24, Hiroshima, Japan, 2016.

  10. Daniel Große; Hoang M. Le; Muhammad Hassan; Rolf Drechsler

    Guided Lightweight Software Test Qualification for IP Integration using Virtual Prototypes

    In: The 34th IEEE International Conference on Computer Design. IEEE International Conference on Computer Design (ICCD-34), October 3-5, Phoenix, USA, 2016.

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