Aufgrund von Wartungsarbeiten ist die Suche von Publikationen nach Autor:innen derzeit nicht möglich.
Lukas Struppek; Dominik Hintersdorf; Antonio De Almeida Correia; Antonia Adler; Kristian Kersting
In: Kamalika Chaudhuri; Stefanie Jegelka; Le Song; Csaba Szepesvári; Gang Niu; Sivan Sabato (Hrsg.). International Conference on Machine Learning. …
Martin Mundt; Steven Lang; Quentin Delfosse; Kristian Kersting
In: The Tenth International Conference on Learning Representations. International Conference on Learning Representations (ICLR-2022), April 25-29, …
Felix Friedrich; Patrick Schramowski; Christopher Tauchmann; Kristian Kersting
In: Stefan Schlobach; María Pérez-Ortiz; Myrthe Tielman (Hrsg.). HHAI 2022: Augmenting Human Intellect - Proceedings of the First International …
Patrick Schramowski; Christopher Tauchmann; Kristian Kersting
In: FAccT '22: Proceedings of the 2022 ACM Conference on Fairness, Accountability, and Transparency. ACM Conference on Fairness, Accountability, and …
Lukas Struppek; Dominik Hintersdorf; Daniel Neider; Kristian Kersting
In: FAccT '22: 2022 ACM Conference on Fairness, Accountability, and Transparency. ACM Conference on Fairness, Accountability, and Transparency (ACM …
Wolfgang Stammer; Marius Memmel; Patrick Schramowski; Kristian Kersting
In: IEEE/CVF Conference on Computer Vision and Pattern Recognition. International Conference on Computer Vision and Pattern Recognition (CVPR-2022), …
Mei Ling Fang; Devendra Singh Dhami; Kristian Kersting
In: Martin Michalowski; Syed Sibte Raza Abidi; Samina Abidi (Hrsg.). Artificial Intelligence in Medicine - 20th International Conference on Artificial …
Julen Urain; Davide Tateo; Jan Peters
In: IEEE Robotics and Automation Letters (RA-L), Vol. 7, No. 4, Pages 12569-12576, IEEE, 2022.
Tuan Dam; Georgia Chalvatzaki; Jan Peters; Joni Pajarinen
In: IEEE Robotics and Automation Letters (RA-L), Vol. 7, No. 4, Pages 11213-11220, IEEE, 2022.
Snehal Jauhri; Jan Peters; Georgia Chalvatzaki
In: IEEE Robotics and Automation Letters (RA-L), Vol. 7, No. 3, Pages 8399-8406, IEEE, 2022.
