In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2020. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2020), ISBN 978-1-7281-9457-8, IEEE, 2020.
In: Twenty-Eighth European Conference on Information Systems (ECIS). European Conference on Information Systems (ECIS), A Virtual AIS Conference, Association for Information Systems, 2020.
In: Proceedings of the Augmented Humans International Conference. Augmented Humans International Conference (AHs-2020), March 16-17, Kaiserslautern, Germany, AHs '20, ISBN 9781450376037, Association for Computing Machinery, 2020.
Manisha Luthra; Sebastian Hennig; Kamran Razavi; Lin Wang; Boris Koldehofe
In: 2020 IEEE International Conference on Big Data (Big Data). IEEE International Conference on Big Data (IEEE BigData-2020), IEEE International Conference on Big Data, Pages 1964-1973, IEEE, 2020.
Robin Rehrmann; Carsten Binnig; Alexander Böhm; Kihong Kim; Wolfgang Lehner
In: Nicoletta Calzolari; Frédéric Béchet; Philippe Blache; Khalid Choukri; Christopher Cieri; Thierry Declerck; Sara Goggi; Hitoshi Isahara; Bente Maegaard; Joseph Mariani; Hélène Mazo; Asunción Moreno; Jan Odijk; Stelios Piperidis (Hrsg.). Proceedings of The 12th Language Resources and Evaluation Conference. International Conference on Language Resources and Evaluation (LREC-2020), May 11-16, Marseille, France, Pages 6700-6708, European Language Resources Association, 2020.