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Publikationen

Zeige Ergebnisse 61 bis 70 von 507.
  1. Peter Fettke; Robert Risse; Fritz Esterer

    Anwendungspotentiale von Deep Learning im Process Mining in der Steuerabteilung am Beispiel von Henkel

    In: IM+io, Vol. 4, Pages 84-89, AWSI Publishing, 12/2017.

  2. Jumyung Um; Matthieu Rauch; Jy Hascoet; Ian Stroud

    STEP-NC compliant process planning of additive manufacturing: Remanufacturing

    In: International Journal of Advanced Manufacturing Technology, Vol. 88, Pages 1215-1230, Springer, 2017.

  3. Marie-Helene Stoltz; Vaggelis Giannikas; Duncan Mcfarlane; James Strachan; Jumyung Um; Rengarajan Srinivasan

    Augmented Reality in Warehouse Operations: Oppaortunities and Barriers

    In: IFAC-PapersOnLine, Vol. 50, No. 1, Pages 12979-12984, Elsevier, 2017.

  4. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual Meeting, May 17-19, St. Pete Beach, FL, USA, Purdue University, 5/2017.

  5. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  6. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November 13-16, Irvine, CA, USA, 2017.

  7. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom, 2017.

  8. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom, 2017.