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Zeige Ergebnisse 51 bis 60 von 541
  1. Andreas Harth; Tobias Käfer; Felix Leif Keppmann; Dimitri Rubinstein; René Schubotz; Christian Vogelgesang

    Industrielle VT-Anwendungen auf Basis von Web-Technologien

    In: VDE-Kongress 2016 "Internet der Dinge - Technologien / Anwendungen / Perspektiven". VDE Kongress (Verband der Elektrotechnik Elektronik …

  2. Abdul Mutaal Ahmad; Paul Lukowicz; Jingyuan Cheng

    FPGA based hardware acceleration of sensor matrix

    In: Proceedings of the 2016 ACM International Joint Conference on Pervasive and Ubiquitous Computing: Adjunct. International Joint Conference on …

  3. Bo Zhou; Mathias Sundholm; Jingyuan Cheng; Heber Cruz; Paul Lukowicz

    Measuring muscle activities during gym exercises with textile pressure mapping sensors

    In: Pervasive and Mobile Computing, Vol. 38, No. 2, Pages 331-345, Elsevier, 2016.

  4. Jamie Ward; Paul Lukowicz

    What's my line? glass versus paper for cold reading in duologues

    In: Proceedings of the 2016 ACM International Joint Conference on Pervasive and Ubiquitous Computing: Adjunct. International Joint Conference on …

  5. Peripheral View Calculation in Virtual Reality Applications

    In: Proceedings of the 2016 ACM International Joint Conference on Pervasive and Ubiquitous Computing: Adjunct. International Joint Conference on …

  6. Tim Dahmen; Holger Kohr; Andrew Lupini; Jean-Pierre Beaudoin; Christian Kübel; Patrick Trampert; Philipp Slusallek; Niels de Jonge

    Combined Tilt- and Focal-Series Tomography for HAADF-STEM

    In: Microscopy Today, Vol. 24, Pages 26-30, Microscopy Today, 5/2016.

  7. Tim Dahmen; Patrick Trampert; Niels de Jonge; Philipp Slusallek

    Advanced recording schemes for electron tomography

    In: MRS Bulletin, Vol. 41, No. 07, Pages 537-541, Cambridge University Press, 7/2016.

  8. Beata Turonova; Lukas Marsalek; Philipp Slusallek

    On geometric artifacts in cryo electron tomography

    In: Ultramicroscopy, Vol. 163, Pages 48-61, Elsevier B.V. 4/2016.

  9. Smart Factory Systems – Fostering Cloud-based Manufacturing based on Self-Monitoring Cyber-Physical Systems

    In: International Journal on Advances in Systems and Measurements, Vol. 9, No. 1 & 2, Pages 91-101, IARIA, 7/2016.

  10. Vladimir Herdt; Hoang M. Le; Daniel Große; Rolf Drechsler

    On the Application of Formal Fault Localization to Automated RTL-to-TLM Fault Correspondence Analysis for Fast and Accurate VP-based Error Effect Simulation - A Case Study

    In: Forum on specification & Design Languages. Forum on Specification & Design Languages (FDL), September 14-16, Bremen, Germany, 2016.