Aufgrund von Wartungsarbeiten ist die Suche von Publikationen nach Autor:innen derzeit nicht möglich.
Akansha Bhardwaj; Dominique Mercier; Andreas Dengel; Sheraz Ahmed
In: International Conference on Neural Information Processing. International Conference on Neural Information Processing (ICONIP-2017), 24th …
Hans-Wolfgang Micklitz; Lucia Reisch; Gesche Joost; Helga Zander-Hayat (Hrsg.)
ISBN 9783848741878, Nomos, 2017.
Hristina Uzunova; Matthias Wilms; Heinz Handels; Jan Ehrhardt
In: Maxime Descoteaux; Lena Maier-Hein; Alfred Franz; Pierre Jannin; D. Louis Collins; Simon Duchesne (Hrsg.). Medical Image Computing and Computer …
Andreas Schoknecht; Tom Thaler; Peter Fettke; Andreas Oberweis; Ralf Laue
In: ACM Computing Surveys (CSUR), Vol. 50, No. 4, Pages 52:1-52:33, ACM New York, New York, NY, USA, 8/2017.
Ayushman Dash; John Cristian Borges Gamboa; Sheraz Ahmed; Marcus Liwicki; Muhammad Zeshan Afzal
arxiv, 2017.
Octavia-Maria Şulea; Marcos Zampieri; Shervin Malmasi; Mihaela Vela; Liviu P. Dinu; Josef van Genabith
In: Proceedings of the Second Workshop on Automated Semantic Analysis of Information in Legal Text. Automated Semantic Analysis of Information in …
Johannes Bayer (Hrsg.)
IAPR International Workshop on Graphics Recognition (GREC-2017), located at 12th IAPR International Workshop on Graphics Recognition, Japan, 2017.
Faysal Boughorbel; Pavel Potocek; Milos Hovorka; Libor Strakos; John Mitchels; Tomas Vystavel; Patrick Trampert; Ben Lich; Tim Dahmen
In: Microscopy and Microanalysis, Vol. 23, No. S1, Pages 150-151, Cambridge University Press, 7/2017.
Arighna Deb; Robert Wille; Rolf Drechsler
In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …
Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler
In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …
