In: Juan Ye; Michael J. O'Grady; Gabriele Civitarese; Kristina Yordanova (Hrsg.). Proceedings of the 10th EAI International Conference on Wireless Mobile Communication and Healthcare. International Conference on Wireless Mobile Communication and Healthcare (MobiHealth-2021), November 13-14, Chongqing/Virtual, China, Pages 315-322, ISBN 978-3-030-70569-5, Springer International Publishing, 2021.
In: Bildverarbeitung für die Medizin 2021: Proceedings, German Workshop on Medical Image Computing, Regensburg, March 7-9, 2021. Workshop Bildverarbeitung für die Medizin (BVM-2021), March 7-9, Regensburg, Germany, Pages 344-349, Springer, 2021.
In: Thomas Tolxdorff; Thomas M. Deserno; Heinz Handels; Andreas Maier; Klaus H. Maier-Hein; Christoph Palm (Hrsg.). Bildverarbeitung für die Medizin 2020. Workshop Bildverarbeitung für die Medizin (BVM-2020), March 15-17, Berlin, Germany, Pages 201-207, ISBN 978-3-658-29267-6, Springer Fachmedien Wiesbaden, 2020.
Hardik Arora; Christoph Langenhan; Frank Petzold; Viktor Eisenstadt; Klaus-Dieter Althoff
In: Proceedings of the European Conference on Product and Process Modeling 2020-2021. European Conference on Product and Process Modeling (ECPPM-2021), May 5-7, Moscow, Russian Federation, European Association of Product and Process Modelling, 2021.
In: 2019 IEEE 31st International Conference on Tools with Artificial Intelligence. International Conference on Tools with Artificial Intelligence (AAAI SSS-2019), November 4-6, Portland, OR, USA, Pages 133-140, ISBN 978-1-7281-3798-8, IEEE Digital Library, 11/2019.
In: Winter Conference on Applications of Computer Vision. IEEE Winter Conference on Applications of Computer Vision (WACV-2021), January 5-9, Waikoloa, HI, USA, IEEE, 2021.
In: 2020 IEEE Electric Power and Energy Conference (EPEC). IEEE Electric Power and Energy Conference (EPEC-2020), November 9-10, Edmonton, AB, Canada, ISBN 978-1-7281-6490-8, IEEE, 2020.
In: International Conference on Pattern Recognition. International Conference on Pattern Recognition (ICPR-2020), 25th International Conference on Pattern Recognition, January 12-15, Milan, Italy, ISBN 978-1-7281-8808-9, IEEE, 5/2021.