Dipl.-Inform. Ludger van Elst

Abdul Hannan Khan; Mohsin Munir; Ludger van Elst; Andreas Dengel

In: 26th International Conference on Pattern Recognition 2022. International Conference on Pattern Recognition (ICPR-2022), August 21-25, Montréal, Québec, Canada, IEEE, 2022.

Kai Krämer; Ludger van Elst; Asier Arteaga

In: Ludger van Elst; Tulay Caglayan Ozlu; Kurosh Madani (Hrsg.). Proceedings of the 3rd International Conference on Innovative Intelligent Industrial Production and Logistics - Volume 1: ETCIIM. International Workshop on Emerging Trends and Case-Studies in Industry 4.0 and Intelligent Manufacturing (ETCIIM-2022), located at 3rd International Conference on Innovative Intelligent Industrial Production and Logistics, Pages 291-296, ISBN 978-989-758-612-5, SciTePress, 2022.

Julian Wörmann; Daniel Bogdoll; Etienne Bührle; Han Chen; Evaristus Fuh Chuo; Kostadin Cvejoski; Ludger van Elst; Philip Gottschall; Stefan Griesche; Christian Hellert; Christian Hesels; Sebastian Houben; Tim Joseph; Niklas Keil; Johann Kelsch; Hendrik Königshof; Erwin Kraft; Leonie Kreuser; Kevin Krone; Tobias Latka; Denny Mattern; Stefan Matthes; Mohsin Munir; Moritz Nekolla; Adrian Paschke; Maximilian Alexander Pintz; Tianming Qiu; Faraz Qureishi; Syed Tahseen Raza Rizvi; Jörg Reichardt; Laura von Rueden; Stefan Rudolph; Alexander Sagel; Tobias Scholl; Gerhard Schunk; Hao Shen; Hendrik Stapelbroek; Vera Stehr; Gurucharan Srinivas; Anh Tuan Tran; Abhishek Vivekanandan; Ya Wang; Florian Wasserrab; Tino Werner; Christian Wirth; Stefan Zwicklbauer

arXiv, 2022.