Publikation

A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization Operators for On-Chip Transient Fault Detection

Marcel Merten, Sebastian Huhn, Rolf Drechsler

In: 40th IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2022) April 25-27 San Diego United States 2022.

Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence