Compact Test Set Generation for Test Compression-based Designs
Stephan Eggersglüß
In: 20th IEEE European Test Symposium. IEEE European Test Symposium (ETS-20), May 25-29, Cluj-Napoca, Romania, 2015.
Compact Test Set Generation for Test Compression-based Designs
@inproceedings{pub7687,
author = {
Eggersglüß, Stephan
},
title = {Compact Test Set Generation for Test Compression-based Designs},
booktitle = {20th IEEE European Test Symposium. IEEE European Test Symposium (ETS-20), May 25-29, Cluj-Napoca, Romania},
year = {2015}
}