System Level Verification of Analog/Mixed-Signal Systems using Metamorphic Relations

Muhammad Hassan, Rolf Drechsler

In: 34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2022) February 27-March 1 Bremerhaven Germany 2022.


Metamorphic Testing (MT) has been employed very successfully in the software domain. The core idea is to uncover bugs by relating consecutive executions of the program under test. In this paper, we present a novel MT-based verification approach to verify Analog/Mixed-Signal (AMS) systems at system level. The central element of our MT-approach is a set of Metamorphic Relations (MRs) which describes the relation of inputs and outputs of consecutive DUV executions. We demonstrate the effectiveness of our MT-based verification approach on Low Noise Amplifiers (LNA) and Phase-locked Loop (PLL).


Deutsches Forschungszentrum für Künstliche Intelligenz
German Research Center for Artificial Intelligence