In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November 13-16, Irvine, CA, USA, 2017.
Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler
In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom, 2017.
Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler
In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom, 2017.
In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.
Patrick Elfert; Marco Eichelberg; Johannes Tröger; Jochen Britz; Jan Alexandersson; Daniel Bieber; Jürgen Bauer; Susanne Teichmann; Ludwig Kuhn; Martin Thielen; Janina Sauer; Alexander Münzberg; Norbert Rösch; Julia Woizischke; Rebeacca Diekmann; Andreas Hein
In: 2017 IEEE Symposium on Computers and Communications (ISCC). IEEE Symposium on Computers and Communications (ISCC-2017), 22nd, July 3-6, Heraklion, Greece, Pages 100-104, ISBN 978-1-5386-1629-1, IEEE, 9/2017.
