Publication

Power-aware Test Scheduling Framework for IEEE 1687 Multi-Power Domain Networks using Formal Techniques

Payam Habiby, Sebastian Huhn, Rolf Drechsler

In: Dr. M. Hashimoto (editor). Microelectronics Reliability Pages 01-11 Elsevier 2022.

German Research Center for Artificial Intelligence
Deutsches Forschungszentrum für Künstliche Intelligenz