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Publications

 

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Displaying results 51 to 60 of 501.
  1. Beata Turonova; Lukas Marsalek; Tomás Davidovic; Philipp Slusallek

    Progressive Stochastic Reconstruction Technique for Cryo Electron Tomography

    In: SIGGRAPH Asia 2013 Posters. ACM SiggraphAsia (SigAsia-13), November 19-22, Hong Kong, Pages 11:1-11:1, ISBN 978-1-4503-2634-6, ACM, 2013.

  2. Evgeny Bogdanov; Carsten Ullrich; Erik Isaksson; Matthias Palmér; Denis Gillet

    Towards PLEs through Widget Spaces in Moodle

    In: Computer Science and Information Systems Journal, Vol. 11, No. 1, Pages 443-460, ComSIS Consortium, 2013.

  3. Max Feltes; Sheraz Ahmed; Andreas Dengel; Marcus Liwicki

    Improved Contour-Based Corner Detection for Architectural Floor Plans

    In: Graphics Recognition. Current Trends and Challenges (Hrsg.). GREC. IAPR International Workshop on Graphics Recognition (GREC-13), Springer, 2013.

  4. Technische Gestaltungsoptionen für autonom agierende Komponenten und Systeme

    In: 1. Würzburger Tagung zu Technikrecht. Würzburger Tagung zu Technikrecht, November 15-16, Würzburg, Germany, 11/2013.

  5. Europa, Deine Sprachen.

    In: Philipp Otto. Das Netz 2013/2014. Pages 128-131, iRights Media, Berlin, 12/2013.

  6. Thomas Röfer; Tim Laue; Judith Müller; Michel Bartsch; Malte Jonas Batram; Arne Böckmann; Martin Böschen; Martin Kroker; Florian Maaß; Thomas Münder; Marcel Steinbeck; Andreas Stolpmann; Simon Taddiken; Alexis Tsogias; Felix Wenk

    B-Human Team Report and Code Release 2013

    2013.

  7. Alekh Jindal; Endre Palatinus; Vladimir Pavlov; Jens Dittrich

    A Comparison of Knives for Bread Slicing

    In: Peer Kröger; Stratis D. Viglas (Hrsg.). Proceedings of the 39th International Conference on Very Large Data Bases. International Conference on …

  8. Frederik Wiehr; Vidya Setlur; Alark Joshi

    DriveSense: Contextual handling of large-scale route map data for the automobile

    In: IEEE Conference Publications. IEEE International Conference on Big Data (IEEE BigData-2013), October 6-9, Santa Clara, CA, USA, Pages 87-94, IEEE, …