Due to maintenance work, it is currently not possible to search for publications by author.
Arighna Deb; Robert Wille; Rolf Drechsler
In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …
Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler
In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …
Jochen Kuhn; Shoya Ishimaru; Syed Saqib Bukhari; Carina Heisel; Nicolas Großmann; Andreas Dengel
In: The World Education Leadership Symposium 2017. World Education Leadership Symposium, Education 5.0? The Future of Learning – The Future of …
Viktor Ayzenshtadt; Christoph Langenhan; Syed Saqib Bukhari; Klaus-Dieter Althoff; Frank Petzold; Andreas Dengel
In: The 25th International Conference on Case-Based Reasoning. International Conference on Case-Based Reasoning (ICCBR), June 26-28, Trondheim, …
Johannes Bayer; Syed Saqib Bukhari; Andreas Dengel
In: The 12th IAPR International Workshop on Graphics Recognition (GREC 2017), Kyoto Japan, November 2017. IAPR International Workshop on Graphics …
Amir Moris Monir Riad; Christian Sporer; Syed Saqib Bukhari; Andreas Dengel
In: The 14th IAPR International Conference on Document Analysis and Recognition. International Conference on Document Analysis and Recognition …
Shoya Ishimaru; Syed Saqib Bukhari; Carina Heisel; Nicolas Großmann; Pascal Klein; Jochen Kuhn; Andreas Dengel
In: IEEE Transactions on Learning Technologies, Vol. 1, Pages 387-398, Springer, 2017.
Muhammet Bastan; Syed Saqib Bukhari; Thomas Breuel
In: IET Image Processing Journal, Vol. 11, No. 12, Pages 1325-1332, IET, 12/2017.
Peter Lanzer; Mohammad Osamh Adel Al-Naser; Syed Saqib Bukhari; Andreas Dengel; Elizabeth Krupinski
In: Journal of Medical Imaging, Vol. 4, No. 3, Pages 1-9, SPIE, 2017.
Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler
In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …