Publication
Towards Generating Test Suites with High Functional Coverage for Error Effect Simulation
Aljoscha Windhorst; Hoang M. Le; Daniel Große; Rolf Drechsler
In: 1st International ESWEEK Workshop on Resiliency in Embedded Electronic Systems. International ESWEEK Workshop on Resiliency in Embedded Electronic Systems, 1st, October 8, Amsterdam, Netherlands, 2015.