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Payam Habiby; Sebastian Huhn; Rolf Drechsler
In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2020. IEEE International Symposium on Defect …
Nandini Ramanan; Mayukh Das; Kristian Kersting; Sriraam Natarajan
In: Manfred Jaeger; Thomas Dyhre Nielsen (Hrsg.). Proceedings of the 10th International Conference on Probabilistic Graphical Models. International …
Filipe Veiga; Benoni B. Edin; Jan Peters
In: Sensors - Open Access Journal (Sensors), Vol. 20, No. 6, Pages 0-10, MDPI, 2020.