Due to maintenance work, it is currently not possible to search for publications by author.
Benjamin Thiel; Kamil Kloch; Paul Lukowicz
In: PhoneSense '12 Proceedings of the Third International Workshop on Sensing Applications on Mobile Phones. International Workshop on Sensing …
Alois Ferscha; Katayoun Farrahi; Jeroen van den Hoven; David Hales; Andrzej Nowak; Paul Lukowicz; Dirk Helbing
In: The European Physical Journal - Special Topics (EPJ ST), Vol. 214, No. 1, Pages 401-434, Springer, Berlin, 11/2012.
Lassaad Cheikhrouhou; Werner Stephan; Oezguer Dagdelen; Marc Fischlin; Markus Ullmann
In: Neeraj Suri; Michael Waidner (Hrsg.). Sicherheit 2012 - 6. Jahrestagung des Fachbereichs "Sicherheit - Schutz und Zuverlässigkeit" der GI. …
Franca Delmastro; Diane J Cook; Marjorie Skubic; Paul Lukowicz
In: Pervasive and Mobile Computing, Vol. 8, No. 6, Pages 811-812, Elsevier, 12/2012.
Mehdi Moniri; Christian Müller
In: Proceedings of the 4th International Conference on Automotive User Interfaces and Interactive Vehicular Applications. International Conference on …
Sergey Sosnovsky; Michael Dietrich; Eric Andres; Giorgi Goguadze; Stefan Winterstein
In: Andrew Ravenscroft; Stefanie N. Lindstaedt; Carlos Delgado Kloos; Davinia Hernandez Leo (Hrsg.). 21st Century Learning for 21st Century Skills - …
Marcus Liwicki; Markus Weber; Tobias Zimmermann; Andreas Dengel
In: 10th IAPR International Workshop on Document Analysis Systems. IAPR International Workshop on Document Analysis Systems (DAS-10), Pages 364-368, …
Tobias Nöll; Johannes Köhler; Gerd Reis; Didier Stricker
In: International Conference on Digital Image Computing Techniques and Applications 2012. International Conference on Digital Image Computing …
Markus Weber; Marcus Liwicki; Gabriele Bleser; Didier Stricker
In: The 21st International Conference on Pattern Recognition . International Conference on Pattern Recognition (ICPR-21), November 11-15, Tsukuba …
Yan Cui; Sebastian Schuon; Sebastian Thrun; Didier Stricker; Christian Theobalt
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 35, No. 5, Pages 1039-1050, 5/2012.
