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Merton Lansley; Nikolaos Polatidis; Stelios Kapetanakis; Kareem Amin; George Samakovitis; Miltos Petridis
In: Workshops Proceedings for the Twenty-seventh International Conference on Case-Based Reasoning: Case-based reasoning and deep learning workshop. …
Kareem Amin; Stelios Kapetanakis; Klaus-Dieter Althoff; Andreas Dengel; Miltos Petridis
In: 2019 IEEE 31st International Conference on Tools with Artificial Intelligence. International Conference on Tools with Artificial Intelligence …
Redy Andriyansah; Syed Saqib Bukhari; Martin Jenckel; Andreas Dengel
In: HIP '19: Proceedings of the 5th International Workshop on Historical Document Imaging and Processing. International Workshop on Historical …
Mohammad Mohsin Reza; Syed Saqib Bukhari; Martin Jenckel; Andreas Dengel
In: 2019 International Conference on Document Analysis and Recognition Workshops (ICDARW). International Conference on Document Analysis and …
Kumar Shridhar; Joonho Lee; Hideaki Hayashi; Purvanshi Mehta; Brian Kenji Iwana; Seokjun Kang; Seiichi Uchida; Sheraz Ahmed; Andreas Dengel
In: OPT2020: 12th Annual Workshop on Optimization for Machine Learning. Workshop on Optimization for Machine Learning (OPT-2020), located at …
Andreas Dengel
In: Proceedings WCRML19. ACM Workshop on Crossmodal Learning and Application, Ottawa, Canada, ISBN 978-1-4503-6780-6, Association for Computing …
Abhash Sinha; Martin Jenckel; Syed Saqib Bukhari; Andreas Dengel
In: Proceedings ICDAR'19. International Conference on Document Analysis and Recognition (ICDAR-2019), September 20-25, Sydney, Australia, Pages …
Mohsin Munir; Shoaib Ahmed Siddiqui; Ferdinand Küsters; Dominique Mercier; Andreas Dengel; Sheraz Ahmed
In: ICANN. International Conference on Artificial Neural Networks (ICANN-2019), September 17-19, Munich, Germany, Pages 426-439, Vol. 11731, ISBN …
Gencer Sümbül; Marcela Charfuelan Oliva; Begüm Demir; Volker Markl
In: IEEE International Conference on Geoscience and Remote Sensing Symposium. IEEE International Geoscience and Remote Sensing Symposium …
Tim Dahmen; Pavel Potocek; Patrick Trampert; Maurice Peemen; Remco Schoenmakers
In: Microscopy & Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Cambridge University Press, 8/2019.
