Publication
Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy
Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek
In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 700-701, Cambridge University Press, 8/2018.
Abstract
High-throughput scanning electron microscopy (SEM) aims to reduce dose for sensitive specimens as
well as reducing acquisition times to be able to acquire large volumes in a meaningful time. Sparse
sampling is one key to make such acquisitions possible. We propose a new reconstruction technique for
such sparsely sampled SEM data, which is based on exemplar-based inpainting known from image
processing.