Johannes Ihl

Maurice Rekrut; Andreas Fey; Johannes Ihl; Tobias Jungbluth; Matthias Nadig; Antonio Krüger

In: Proceedings of the IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering. IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2022), October 26-28, Rome, Italy, IEEE, 2022.

Maurice Rekrut; Matthias Nadig; Tobias Jungbluth; Johannes Ihl

In: Proceedings of the IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering. IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2022), IEEE, 2022.