Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

@inproceedings{pub10240,
    author = {

Dhotre, Harshad
 and 

Eggersglüß, Stephan
 and 

Dehbashi, Mehdi
 and 

Pfannkuchen, Ulrike
 and 

Drechsler, Rolf
},
    title = {Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas},
    booktitle = {30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom},
    year = {2017}
}