Power-aware Test Scheduling Framework for IEEE 1687 Multi-Power Domain Networks using Formal Techniques

@article{pub12337,
    author = {

Habiby, Payam
 and 

Huhn, Sebastian
 and 

Drechsler, Rolf
},
    editor = {

Hashimoto, Dr. M.
},
    title = {Power-aware Test Scheduling Framework for IEEE 1687 Multi-Power Domain Networks using Formal Techniques},
    year = {2022},
    pages = {01--11},
    journal = {Microelectronics Reliability},
    publisher = {Elsevier}
}