Towards Generating Test Suites with High Functional Coverage for Error Effect Simulation

@inproceedings{pub10252,
    author = {

Windhorst, Aljoscha
 and 

Le, Hoang M.
 and 

Große, Daniel
 and 

Drechsler, Rolf
},
    title = {Towards Generating Test Suites with High Functional Coverage for Error Effect Simulation},
    booktitle = {1st International ESWEEK Workshop on Resiliency in Embedded Electronic Systems. International ESWEEK Workshop on Resiliency in Embedded Electronic Systems, 1st, October 8, Amsterdam, Netherlands},
    year = {2015}
}